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1 Ergebnisse
1
Fault Modeling and Testing of Memristor-Based Spiking Neura..:
, In:
2022 IEEE International Test Conference (ITC)
,
Hou, Kuan-Wei
;
Cheng, Hsueh-Hung
;
Tung, Chi
.. - p. 92-99 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00016
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Fault Modeling and Testing of Memristor-Based Spiking Neural Networks
UL https://suche.suub.uni-bremen.de/peid=ieee-9983882&Exemplar=1&LAN=DE A1 Hou, Kuan-Wei A1 Cheng, Hsueh-Hung A1 Tung, Chi A1 Wu, Cheng-Wen A1 Lu, Juin-Ming YR 2022 SN 2378-2250 K1 Analytical models K1 Computational modeling K1 Simulation K1 Neural networks K1 Memory management K1 Memristors K1 Circuit faults K1 Memristor K1 Spiking Neural Network K1 In-Memory Computing K1 Fault Model K1 Fault Simulator K1 Test Algorithm SP 92 OP 99 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00016 DO https://doi.org/10.1109/ITC50671.2022.00016 SF ELIB - SuUB Bremen
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