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1 Ergebnisse
1
Scaling physically aware logic diagnosis to complex high vo..:
, In:
2022 IEEE International Test Conference (ITC)
,
Nandakumar, Bharath
;
Maheshwari, Madhur
;
Chillarige, Sameer
... - p. 340-347 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00042
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Scaling physically aware logic diagnosis to complex high volume 7nm server processors
UL https://suche.suub.uni-bremen.de/peid=ieee-9983883&Exemplar=1&LAN=DE A1 Nandakumar, Bharath A1 Maheshwari, Madhur A1 Chillarige, Sameer A1 Redburn, Robert A1 Zimmerman, Jeff A1 Esperance, Nicholai L A1 Dziarcak, Edward YR 2022 SN 2378-2250 K1 Scalability K1 Microprocessors K1 Pipelines K1 Layout K1 Servers K1 Object recognition K1 VLSI K1 physical diagnostics K1 yield K1 volume diagnosis K1 scalability SP 340 OP 347 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00042 DO https://doi.org/10.1109/ITC50671.2022.00042 SF ELIB - SuUB Bremen
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