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1 Ergebnisse
1
Wafer Defect Pattern Classification with Explainable-Decisi..:
, In:
2022 IEEE International Test Conference (ITC)
,
Cheng, Ken Chau-Cheung
;
Li, Katherine Shu-Min
;
Wang, Sying-Jyan
... - p. 549-553 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00070
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Wafer Defect Pattern Classification with Explainable-Decision Tree Technique
UL https://suche.suub.uni-bremen.de/peid=ieee-9983895&Exemplar=1&LAN=DE A1 Cheng, Ken Chau-Cheung A1 Li, Katherine Shu-Min A1 Wang, Sying-Jyan A1 Huang, Andrew Yi-Ann A1 Lee, Chen-Shiun A1 Chen, Leon Li-Yang A1 Liao, Peter Yi-Yu A1 Tsai, Nova Cheng-Yen YR 2022 SN 2378-2250 K1 Training K1 Fabrication K1 Root cause analysis K1 Manufacturing processes K1 Pattern classification K1 Pattern recognition K1 Decision trees K1 wafer defect map K1 classification K1 machine learning K1 explainable AI K1 data analysis SP 549 OP 553 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00070 DO https://doi.org/10.1109/ITC50671.2022.00070 SF ELIB - SuUB Bremen
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