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1 Ergebnisse
1
High-Coverage DfT and Reliability Enhancements for Automoti..:
, In:
2022 IEEE International Test Conference (ITC)
,
Von Staudt, Hans Martin
;
Schuler, Franz
;
Bhattacharya, Rohitaswa
... - p. 637-641 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00088
RT T1
2022 IEEE International Test Conference (ITC)
: T1
High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100
UL https://suche.suub.uni-bremen.de/peid=ieee-9983909&Exemplar=1&LAN=DE A1 Von Staudt, Hans Martin A1 Schuler, Franz A1 Bhattacharya, Rohitaswa A1 Cheng, Justin Wei-Lin A1 Huang, Cheng-Da A1 Chen, Parker Chih-Chun YR 2022 SN 2378-2250 K1 Nonvolatile memory K1 Power supplies K1 Power system management K1 Redundancy K1 System-on-chip K1 Safety K1 Reliability K1 Automotive K1 AEC-Q100 K1 Floating Gate K1 OTP K1 NVM K1 functional safety K1 reliability K1 test coverage K1 ATPG K1 PMIC K1 power management SP 637 OP 641 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00088 DO https://doi.org/10.1109/ITC50671.2022.00088 SF ELIB - SuUB Bremen
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