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1 Ergebnisse
1
Defect-Directed Stress Testing Based on Inline Inspection R..:
, In:
2022 IEEE International Test Conference (ITC)
,
He, Chen
;
Grosch, Paul
;
Anilturk, Onder
... - p. 427-435 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00050
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Defect-Directed Stress Testing Based on Inline Inspection Results
UL https://suche.suub.uni-bremen.de/peid=ieee-9983911&Exemplar=1&LAN=DE A1 He, Chen A1 Grosch, Paul A1 Anilturk, Onder A1 Witowski, Joyce A1 Ford, Carl A1 Kalyan, Rahul A1 Robinson, John C. A1 Price, David W. A1 Rathert, Jay A1 Saville, Barry A1 Lee, Dave YR 2022 SN 2378-2250 K1 Integrated circuits K1 Costs K1 Automotive applications K1 Inspection K1 Silicon K1 Reliability K1 Stress K1 Defect K1 Inline Inspection K1 Test SP 427 OP 435 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00050 DO https://doi.org/10.1109/ITC50671.2022.00050 SF ELIB - SuUB Bremen
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