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1 Ergebnisse
1
Low Cost High Accuracy Stimulus Generator for On-chip Spect..:
, In:
2022 IEEE International Test Conference (ITC)
,
Bhatheja, Kushagra
;
Chaganti, Shravan
;
Chen, Degang
... - p. 514-518 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00063
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing
UL https://suche.suub.uni-bremen.de/peid=ieee-9983913&Exemplar=1&LAN=DE A1 Bhatheja, Kushagra A1 Chaganti, Shravan A1 Chen, Degang A1 Jin, Xiankun Robert A1 Dao, Chris C A1 Ren, Juxiang A1 Kumar, Abhishek A1 Correa, Daniel A1 Lehmann, Mark A1 Rodriguez, Thomas A1 Kingham, Eric A1 Knight, Joel R A1 Dobbin, Allan A1 Herrin, Scott W A1 Garrity, Doug YR 2022 SN 2378-2250 K1 Performance evaluation K1 Semiconductor device measurement K1 Costs K1 Linearity K1 CMOS technology K1 Signal generators K1 Generators K1 On-chip spectral testing K1 functional safety K1 reliability K1 stimulus generator K1 INL estimation K1 pre-distortion K1 BIST SP 514 OP 518 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00063 DO https://doi.org/10.1109/ITC50671.2022.00063 SF ELIB - SuUB Bremen
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