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1 Ergebnisse
1
Improving Test Quality of Memory Chips by a Decision Tree-B..:
, In:
2022 IEEE International Test Conference (ITC)
,
Cheng, Ya-Chi
;
Tan, Pai-Yu
;
Wu, Cheng-Wen
... - p. 601-608 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00080
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method
UL https://suche.suub.uni-bremen.de/peid=ieee-9983925&Exemplar=1&LAN=DE A1 Cheng, Ya-Chi A1 Tan, Pai-Yu A1 Wu, Cheng-Wen A1 Shieh, Ming-Der A1 Chuang, Chien-Hui A1 Liao, Gordon YR 2022 SN 2378-2250 K1 Integrated circuits K1 Costs K1 Machine learning algorithms K1 Random access memory K1 Training data K1 Machine learning K1 Prediction algorithms K1 decision tree K1 HTOL test K1 IC testing K1 machine learning K1 memory K1 quality K1 reliability K1 stress test SP 601 OP 608 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00080 DO https://doi.org/10.1109/ITC50671.2022.00080 SF ELIB - SuUB Bremen
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