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1 Ergebnisse
1
Automatic Structural Test Generation for Analog Circuits us..:
, In:
2022 IEEE International Test Conference (ITC)
,
Talukdar, Jonti
;
Chaudhuri, Arjun
;
Bhattacharya, Mayukh
. - p. 145-154 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00022
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Automatic Structural Test Generation for Analog Circuits using Neural Twins
UL https://suche.suub.uni-bremen.de/peid=ieee-9983931&Exemplar=1&LAN=DE A1 Talukdar, Jonti A1 Chaudhuri, Arjun A1 Bhattacharya, Mayukh A1 Chakrabarty, Krishnendu YR 2022 SN 2378-2250 K1 Training K1 MOSFET K1 Neural networks K1 Optimization methods K1 Reinforcement learning K1 Analog circuits K1 Threshold voltage K1 Neural Twin K1 Defect oriented test K1 Machine Learning K1 Reinforcement Learning K1 Analog test generation SP 145 OP 154 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00022 DO https://doi.org/10.1109/ITC50671.2022.00022 SF ELIB - SuUB Bremen
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