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1 Ergebnisse
1
Comprehensive Power-Aware ATPG Methodology for Complex Low-..:
, In:
2022 IEEE International Test Conference (ITC)
,
Abdel-Hafez, Khader
;
Dsouza, Michael
;
Manchukonda, Likith Kumar
... - p. 334-339 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00041
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs
UL https://suche.suub.uni-bremen.de/peid=ieee-9983937&Exemplar=1&LAN=DE A1 Abdel-Hafez, Khader A1 Dsouza, Michael A1 Manchukonda, Likith Kumar A1 Tsai, Elddie A1 Natarajan, Karthikeyan A1 Tai, Ting-Pu A1 Hsueh, Wenhao A1 Lai, Smith YR 2022 SN 2378-2250 K1 Semiconductor device measurement K1 Power demand K1 Power measurement K1 Estimation K1 Switches K1 Automatic test pattern generation K1 Silicon K1 Low power test K1 Power-Aware automatic test pattern generation (ATPG) K1 manufacturing test K1 IR drop SP 334 OP 339 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00041 DO https://doi.org/10.1109/ITC50671.2022.00041 SF ELIB - SuUB Bremen
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