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1 Ergebnisse
1
Fault Diagnosis for Resistive Random-Access Memory and Mono..:
, In:
2022 IEEE International Test Conference (ITC)
,
Hung, Shao-Chun
;
Chaudhuri, Arjun
;
Banerjee, Sanmitra
. - p. 118-127 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00019
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration
UL https://suche.suub.uni-bremen.de/peid=ieee-9983944&Exemplar=1&LAN=DE A1 Hung, Shao-Chun A1 Chaudhuri, Arjun A1 Banerjee, Sanmitra A1 Chakrabarty, Krishnendu YR 2022 SN 2378-2250 K1 Fault diagnosis K1 Resistance K1 Three-dimensional displays K1 Manufacturing processes K1 Simulation K1 Memory architecture K1 SPICE SP 118 OP 127 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00019 DO https://doi.org/10.1109/ITC50671.2022.00019 SF ELIB - SuUB Bremen
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