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1 Ergebnisse
1
Partial Discharge Behaviour Evaluation on MOSFET Employed i..:
, In:
2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
,
Akbar, G.
;
Imburgia, A.
;
Rizzo, G.
... - p. 337-340 , 2022
Link:
https://doi.org/10.1109/CEIDP55452.2022.9985329
RT T1
2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
: T1
Partial Discharge Behaviour Evaluation on MOSFET Employed in Automotive Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9985329&Exemplar=1&LAN=DE A1 Akbar, G. A1 Imburgia, A. A1 Rizzo, G. A1 Fatta, Alessio Di A1 Kaziz, Sinda A1 Romano, P. A1 Ala, G. A1 Viola, F. YR 2022 SN 2576-2397 K1 Partial discharges K1 MOSFET K1 Voltage measurement K1 Silicon carbide K1 Discharges (electric) K1 Corona K1 Silicon K1 partial discharge K1 automotive K1 power electronics K1 SiC SP 337 OP 340 LK http://dx.doi.org/https://doi.org/10.1109/CEIDP55452.2022.9985329 DO https://doi.org/10.1109/CEIDP55452.2022.9985329 SF ELIB - SuUB Bremen
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