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Partial Discharge Behaviour Evaluation on MOSFET Employed i..:

, In: 2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP),
Akbar, G. ; Imburgia, A. ; Rizzo, G.... - p. 337-340 , 2022
Link: https://doi.org/10.1109/CEIDP55452.2022.9985329