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1 Ergebnisse
1
Performance Analysis of Compound III-V Semiconductor Materi..:
, In:
2022 IEEE 9th Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)
,
Maurya, Ashish
;
Ahmad, Md Akram
;
Kumar, Pankaj
.. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/UPCON56432.2022.9986476
RT T1 <cTitle>2022 IEEE 9th Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)</cTitle>: T1 <Title>Performance Analysis of Compound III-V Semiconductor Materials based MOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9986476&Exemplar=1&LAN=DE A1 Maurya, Ashish A1 Ahmad, Md Akram A1 Kumar, Pankaj A1 Kumar, Jitendra A1 Koley, Kalyan YR 2022 SN 2687-7767 K1 Performance evaluation K1 Integrated circuits K1 MOSFET K1 Materials reliability K1 MOSFET circuits K1 Silicon K1 Nanoscale devices K1 III- V semiconductor materials K1 DIBL SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/UPCON56432.2022.9986476 DO https://doi.org/10.1109/UPCON56432.2022.9986476 SF ELIB - SuUB Bremen
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