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Multi-Class Support Vector Machine for Classifying Defect T..:

, In: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD),
Jo, Hyun Bin ; Ryoo, Hong Je ; Ahn, Jae Beom... - p. 217-220 , 2022
Link: https://doi.org/10.23919/CMD54214.2022.9991523