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An AFM Scanning Method with a Rotating Probe and an Adaptiv..:

, In: 2022 IEEE 61st Conference on Decision and Control (CDC),
Lee, Sheng-An ; Chen, Huang-Chih ; Wei, Hsiang-Hung. - p. 7630-7635 , 2022
Link: https://doi.org/10.1109/CDC51059.2022.9993133