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1 Ergebnisse
1
Instrument Fault Diagnosis Method based on Machine Learning:
, In:
2022 IEEE 5th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE)
,
Wang, Hainuo
;
Liu, Yangsen
;
Zhang, Yucong
... - p. 673-678 , 2022
Link:
https://doi.org/10.1109/AUTEEE56487.2022.9994556
RT T1 <cTitle>2022 IEEE 5th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE)</cTitle>: T1 <Title>Instrument Fault Diagnosis Method based on Machine Learning</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9994556&Exemplar=1&LAN=DE A1 Wang, Hainuo A1 Liu, Yangsen A1 Zhang, Yucong A1 Wang, Zhiyuan A1 Shao, Yingzhe A1 Zhang, Xin A1 Tang, Lin A1 Chen, Jiayu YR 2022 SN 2831-4549 K1 Machine learning algorithms K1 Instruments K1 Clustering algorithms K1 Predictive models K1 Feature extraction K1 Data models K1 Classification algorithms K1 PCA K1 random forest algorithm K1 K-means K1 Gaussian mixture distribution K1 Gauss-naive Bayes method SP 673 OP 678 LK http://dx.doi.org/https://doi.org/10.1109/AUTEEE56487.2022.9994556 DO https://doi.org/10.1109/AUTEEE56487.2022.9994556 SF ELIB - SuUB Bremen
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