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Tip Reconstruction for the Atomic Force Microscope:

Miller, Richard ; Vesenka, James ; Henderson, Eric
SIAM Journal on Applied Mathematics. 55 (1995) 5 - p. 1362-1371 , 1995

Link: https://www.jstor.org/stable/2102579

RT Journal
T1 <Title>Tip Reconstruction for the Atomic Force Microscope</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-2102579&Exemplar=1&LAN=DE
				
A1 Miller, Richard
A1 Vesenka, James
A1 Henderson, Eric
PB Society for Industrial and Applied Mathematics
YR 1995
SN 0036-1399
K1 atomic force microscope
K1 differential equation
K1 image analysis
K1 Applied sciences
K1 Engineering
K1 Optical engineering
K1 Optical equipment
K1 Microscopes
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K1 Imaging
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K1 Image reconstruction
K1 Mathematics
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K1 Approximation
K1 Pure mathematics
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K1 Geometric properties
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K1 Three dimensional imaging
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JF SIAM Journal on Applied Mathematics
VO 55
IS 5
SP 1362
OP 1371
LK http://dx.doi.org/https://www.jstor.org/stable/2102579
DO https://www.jstor.org/stable/2102579
SF ELIB - SuUB Bremen

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