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Pattern recognition for evaluator errors in a credit scorin..:

Sohn, SY ; Doo, MK ; Ju, YH
The Journal of the Operational Research Society. 63 (2012) 8 - p. 1051-1064 , 2012

Link: https://www.jstor.org/stable/23251222

RT Journal
T1 <Title>Pattern recognition for evaluator errors in a credit scoring model for technology-based SMEs</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-23251222&Exemplar=1&LAN=DE
				
A1 Sohn, SY
A1 Doo, MK
A1 Ju, YH
PB Palgrave Macmillan
YR 2012
SN 0160-5682
SN 1476-9360
K1 Behavioral sciences
K1 Psychology
K1 Cognitive psychology
K1 Cognitive processes
K1 Decision making
K1 Decision analysis
K1 Decision trees
K1 Economics
K1 Economic disciplines
K1 Financial economics
K1 Credit
K1 Mathematics
K1 Mathematical values
K1 Critical values
K1 Extrema
K1 Mathematical minima
K1 Decision theory
K1 Operations research
K1 Political science
K1 Government
K1 Public administration
K1 Public policy
K1 Technology policy
K1 Technology transfer
K1 Applied sciences
K1 Computer science
K1 Computer engineering
K1 Computer technology
K1 Information technology
K1 Technology
K1 Research methods
K1 Modeling
K1 Law
K1 Civil law
K1 Property law
K1 Intellectual property law
K1 Patent law
K1 Patents
K1 Utility patents
JF The Journal of the Operational Research Society
VO 63
IS 8
SP 1051
OP 1064
LK http://dx.doi.org/https://www.jstor.org/stable/23251222
DO https://www.jstor.org/stable/23251222
SF ELIB - SuUB Bremen

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