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Visualization of carrier dynamics in p(n)-type GaAs byscann..:

Cho, Jongweon ; Hwang, Taek Yong ; Zewail, Ahmed H.
Proceedings of the National Academy of Sciences of the United States of America. 111 (2014) 6 - p. 2094-2099 , 2014

Link: https://www.jstor.org/stable/23768822

RT Journal
T1 <Title>Visualization of carrier dynamics in p(n)-type GaAs byscanning ultrafast electron microscopy</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-23768822&Exemplar=1&LAN=DE
				
A1 Cho, Jongweon
A1 Hwang, Taek Yong
A1 Zewail, Ahmed H.
PB National Academy of Sciences
YR 2014
SN 0027-8424
SN 1091-6490
K1 Physical sciences
K1 Physics
K1 Microphysics
K1 Particle physics
K1 Charged particles
K1 Charge carriers
K1 Applied sciences
K1 Materials science
K1 Materials
K1 Condensed matter physics
K1 Energy bands
K1 Conduction bands
K1 Engineering
K1 Industrial engineering
K1 Manufacturing engineering
K1 Manufacturing
K1 Doping
K1 Subatomic particles
K1 Bosons
K1 Photons
K1 Chemistry
K1 Physical chemistry
K1 Quantum chemistry
K1 Electronic structure
K1 Optical engineering
K1 Optical equipment
K1 Lasers
K1 Energetic particles
K1 Electrons
K1 Particle emission
K1 Electron emission
K1 Laboratory techniques
K1 Microscopy
K1 Electron microscopy
JF Proceedings of the National Academy of Sciences of the United States of America
VO 111
IS 6
SP 2094
OP 2099
LK http://dx.doi.org/https://www.jstor.org/stable/23768822
DO https://www.jstor.org/stable/23768822
SF ELIB - SuUB Bremen

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