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1 Ergebnisse
1
4D multiple-cathode ultrafast electron microscopy:
Baskin, John Spencer
;
Liu, Haihua
;
Zewail, Ahmed H.
Proceedings of the National Academy of Sciences of the United States of America. 111 (2014) 29 - p. 10479-10484 , 2014
Link:
https://www.jstor.org/stable/23803662
RT Journal T1
4D multiple-cathode ultrafast electron microscopy
UL https://suche.suub.uni-bremen.de/peid=jstor-23803662&Exemplar=1&LAN=DE A1 Baskin, John Spencer A1 Liu, Haihua A1 Zewail, Ahmed H. PB National Academy of Sciences YR 2014 SN 0027-8424 SN 1091-6490 K1 Applied sciences K1 Engineering K1 Electrical engineering K1 Electronic components K1 Electrodes K1 Cathodes K1 Imaging K1 Physical sciences K1 Physics K1 Fundamental forces K1 Electromagnetism K1 Electromagnetic radiation K1 Coherent radiation K1 Laser beams K1 Optical engineering K1 Optical equipment K1 Lasers K1 Laboratory techniques K1 Microscopy K1 Electron microscopy K1 Mechanics K1 Wave mechanics K1 Waves K1 Wave phenomena K1 Wave diffraction K1 Microscopes K1 Microphysics K1 Particle physics K1 Corpuscular radiation K1 Electron radiation K1 Electron beams K1 Gas lasers K1 Ultraviolet lasers K1 Technology K1 Tools K1 Measuring instruments K1 Analyzers K1 Electron probes JF Proceedings of the National Academy of Sciences of the United States of America VO 111 IS 29 SP 10479 OP 10484 LK http://dx.doi.org/https://www.jstor.org/stable/23803662 DO https://www.jstor.org/stable/23803662 SF ELIB - SuUB Bremen
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