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Stress test for a technology credit guarantee fund based on..:
Ju, Yonghan
;
Sohn, So Young
The Journal of the Operational Research Society. 66 (2015) 3 - p. 463-475 , 2015
Link:
http://www.jstor.org/stable/24505332
RT Journal T1 <Title>Stress test for a technology credit guarantee fund based on survival analysis</Title> UL https://suche.suub.uni-bremen.de/peid=jstor-24505332&Exemplar=1&LAN=DE A1 Ju, Yonghan A1 Sohn, So Young PB Palgrave Macmillan YR 2015 SN 0160-5682 SN 1476-9360 JF The Journal of the Operational Research Society VO 66 IS 3 SP 463 OP 475 LK http://www.jstor.org/stable/24505332 DO http://www.jstor.org/stable/24505332 SF ELIB - SuUB Bremen
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