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Neutron reflectometry on highly absorbing films and its app..:

Piscitelli, F. ; Khaplanov, A. ; Devishvili, A....
Proceedings: Mathematical, Physical and Engineering Sciences. 472 (2016) 2185 - p. 1-14 , 2016

Link: http://www.jstor.org/stable/24738731

RT Journal
T1 <Title>Neutron reflectometry on highly absorbing films and its application to10B4C-based neutron detectors</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-24738731&Exemplar=1&LAN=DE
				
A1 Piscitelli, F.
A1 Khaplanov, A.
A1 Devishvili, A.
A1 Schmidt, S.
A1 Höglund, C.
A1 Birch, J.
A1 Dennison, A. J. C.
A1 Gutfreund, P.
A1 Hall-Wilton, R.
A1 Van Esch, P.
PB THE ROYAL SOCIETY
YR 2016
SN 1364-5021
K1 Physical sciences
K1 Physics
K1 Microphysics
K1 Particle physics
K1 Subatomic particles
K1 Fermions
K1 Baryons
K1 Neutrons
K1 Applied sciences
K1 Materials science
K1 Material properties
K1 Optical properties
K1 Reflectance
K1 Mechanics
K1 Wave mechanics
K1 Waves
K1 Wave phenomena
K1 Wave reflection
K1 Specular reflection
K1 Technology
K1 Tools
K1 Measuring instruments
K1 Radiation measuring instruments
K1 Radiation counters
K1 Neutron counters
K1 Fundamental forces
K1 Electromagnetism
K1 Electromagnetic radiation
K1 Light
K1 Luminescence
K1 Fluorescence
K1 Materials
K1 Material films
K1 Thin films
K1 Wavelengths
K1 Spectral reflectance
K1 Chemistry
K1 Chemical compounds
K1 Chalcogenides
K1 Oxides
JF Proceedings: Mathematical, Physical and Engineering Sciences
VO 472
IS 2185
SP 1
OP 14
LK http://www.jstor.org/stable/24738731
DO http://www.jstor.org/stable/24738731
SF ELIB - SuUB Bremen

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