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1 Ergebnisse
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Silicon as a Model Ion Trap: Time Domain Measurements of Do..:
Vinh, N. Q.
;
Greenland, P. T.
;
Litvinenko, K.
...
Proceedings of the National Academy of Sciences of the United States of America. 105 (2008) 31 - p. 10649-10653 , 2008
Link:
https://www.jstor.org/stable/25463215
RT Journal T1
Silicon as a Model Ion Trap: Time Domain Measurements of Donor Rydberg states
UL https://suche.suub.uni-bremen.de/peid=jstor-25463215&Exemplar=1&LAN=DE A1 Vinh, N. Q. A1 Greenland, P. T. A1 Litvinenko, K. A1 Redlich, B. A1 van der Meer, A. F. G. A1 Lynch, S. A. A1 Warner, M. A1 Stoneham, A. M. A1 Aeppli, G. A1 Paul, D. J. A1 Pidgeon, C. R. A1 Murdin, B. N. PB National Academy of Sciences YR 2008 SN 0027-8424 K1 Coherence K1 Free electron laser K1 Quantum information K1 Picosecond population dynamics K1 Hydrogenic donor impurity K1 Physical sciences K1 Chemistry K1 Chemical elements K1 Metalloids K1 Silicon K1 Applied sciences K1 Materials science K1 Material properties K1 Impurities K1 Engineering K1 Mechanical engineering K1 Machinery K1 Pumps K1 Physics K1 Microphysics K1 Atomic physics K1 Atoms K1 Mechanics K1 Wave mechanics K1 Waves K1 Elastic waves K1 Phonons K1 Optical engineering K1 Optical equipment K1 Lasers K1 Particle physics K1 Energy levels K1 Ground state K1 Physical chemistry K1 Nuclear chemistry K1 Ion chemistry K1 Ionization K1 Subatomic particles K1 Bosons K1 Photons K1 Technology K1 Tools K1 Measuring instruments K1 Ion traps JF Proceedings of the National Academy of Sciences of the United States of America VO 105 IS 31 SP 10649 OP 10653 LK http://dx.doi.org/https://www.jstor.org/stable/25463215 DO https://www.jstor.org/stable/25463215 SF ELIB - SuUB Bremen
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