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Gate fidelity and coherence of an electron spin in an Si/Si..:
Kawakami, Erika
;
Jullien, Thibaut
;
Scarlino, Pasquale
...
Proceedings of the National Academy of Sciences of the United States of America. 113 (2016) 42 - p. 11738-11743 , 2016
Link:
https://www.jstor.org/stable/26472090
RT Journal T1 <Title>Gate fidelity and coherence of an electron spin in an Si/SiGe quantum dot with micromagnet</Title> UL https://suche.suub.uni-bremen.de/peid=jstor-26472090&Exemplar=1&LAN=DE A1 Kawakami, Erika A1 Jullien, Thibaut A1 Scarlino, Pasquale A1 Ward, Daniel R. A1 Savage, Donald E. A1 Lagally, Max G. A1 Dobrovitski, Viatcheslav V. A1 Friesen, Mark A1 Coppersmith, Susan N. A1 Eriksson, Mark A. A1 Vandersypen, Lieven M. K. PB National Academy of Sciences YR 2016 SN 0027-8424 SN 1091-6490 K1 Si/SiGe quantum dot K1 qubit K1 dynamical decoupling K1 randomized benchmarking K1 electron spin JF Proceedings of the National Academy of Sciences of the United States of America VO 113 IS 42 SP 11738 OP 11743 LK http://dx.doi.org/https://www.jstor.org/stable/26472090 DO https://www.jstor.org/stable/26472090 SF ELIB - SuUB Bremen
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