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Industry-Level Analysis of Information Technology Return an..:
REN, FEI
;
DEWAN, SANJEEV
Journal of Management Information Systems. 32 (2015) 2 - p. 71-103 , 2015
Link:
https://www.jstor.org/stable/26613993
RT Journal T1 <Title>Industry-Level Analysis of Information Technology Return and Risk: What Explains the Variation?</Title> UL https://suche.suub.uni-bremen.de/peid=jstor-26613993&Exemplar=1&LAN=DE A1 REN, FEI A1 DEWAN, SANJEEV PB Taylor & Francis, Ltd. YR 2015 SN 0742-1222 SN 1557-928X JF Journal of Management Information Systems VO 32 IS 2 SP 71 OP 103 LK http://dx.doi.org/https://www.jstor.org/stable/26613993 DO https://www.jstor.org/stable/26613993 SF ELIB - SuUB Bremen
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