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1 Ergebnisse
1
X-Ray Diffraction Analysis of Pictograph Pigments from Toqu..:
McKee, Edwin H.
;
Thomas, David H.
American Antiquity. 38 (1973) 1 - p. 112-113 , 1973
Link:
https://www.jstor.org/stable/279317
RT Journal T1
X-Ray Diffraction Analysis of Pictograph Pigments from Toquima Cave, Central Nevada
UL https://suche.suub.uni-bremen.de/peid=jstor-279317&Exemplar=1&LAN=DE A1 McKee, Edwin H. A1 Thomas, David H. PB Society for American Archaeology YR 1973 SN 0002-7316 K1 Applied sciences K1 Materials science K1 Materials K1 Pigments K1 Physical sciences K1 Earth sciences K1 Geography K1 Geomorphology K1 Caves K1 Geology K1 Mineralogy K1 Minerals K1 Business K1 Industry K1 Industrial sectors K1 Manufacturing industries K1 Chemicals industries K1 Chemical products K1 Paints K1 Linguistics K1 Language K1 Orthographies K1 Ideographs K1 Pictographs K1 Sulfate minerals K1 Gypsum K1 Petrology K1 Igneous petrology K1 Igneous rocks K1 Volcanic rocks K1 Tuff K1 Physics K1 Mechanics K1 Wave mechanics K1 Waves K1 Wave phenomena K1 Wave diffraction K1 X ray diffraction JF American Antiquity VO 38 IS 1 SP 112 OP 113 LK http://dx.doi.org/https://www.jstor.org/stable/279317 DO https://www.jstor.org/stable/279317 SF ELIB - SuUB Bremen
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