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1 Ergebnisse
1
Semiparametric Maximum Likelihood for Nonlinear Regression ..:
Suh, Eun-Young
;
Schafer, Daniel W.
Biometrics. 58 (2002) 2 - p. 448-453 , 2002
Link:
https://www.jstor.org/stable/3068486
RT Journal T1
Semiparametric Maximum Likelihood for Nonlinear Regression with Measurement Errors
UL https://suche.suub.uni-bremen.de/peid=jstor-3068486&Exemplar=1&LAN=DE A1 Suh, Eun-Young A1 Schafer, Daniel W. PB International Biometric Society YR 2002 SN 0006-341X SN 1541-0420 K1 EM Algorithm K1 Errors-in-Variables K1 Growth-Curve Analysis K1 Internal Validation K1 Measurement Error Model Regression K1 Mixture Model K1 Nonparametric Maximum Likelihood K1 Structural Model K1 Vertex Direction Methods K1 Von Bertalanffy Model K1 Mathematics K1 Applied mathematics K1 Analytics K1 Analytical estimating K1 Maximum likelihood estimation K1 Statistics K1 Applied statistics K1 Inferential statistics K1 Statistical estimation K1 Estimation methods K1 Estimators K1 Pure mathematics K1 Geometry K1 Euclidean geometry K1 Plane geometry K1 Vertices K1 Maximum likelihood estimators K1 Information science K1 Information analysis K1 Data analysis K1 Regression analysis K1 Applied sciences K1 Research methods K1 Modeling K1 Computer science K1 Algorithms K1 Health sciences K1 Health care industry K1 Health information K1 Biostatistics K1 Biometrics K1 Statistical models K1 Nonparametric models JF Biometrics VO 58 IS 2 SP 448 OP 453 LK http://dx.doi.org/https://www.jstor.org/stable/3068486 DO https://www.jstor.org/stable/3068486 SF ELIB - SuUB Bremen
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