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Electrical Impedance Tomography by Elastic Deformation:

Ammari, H. ; Bonnetier, E. ; Capdeboscq, Y...
SIAM Journal on Applied Mathematics. 68 (2008) 6 - p. 1557-1573 , 2008

Link: https://www.jstor.org/stable/40233587

RT Journal
T1 <Title>Electrical Impedance Tomography by Elastic Deformation</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-40233587&Exemplar=1&LAN=DE
				
A1 Ammari, H.
A1 Bonnetier, E.
A1 Capdeboscq, Y.
A1 Tanter, M.
A1 Fink, M.
PB Society for Industrial and Applied Mathematics
YR 2008
SN 0036-1399
K1 electrical impedance tomography
K1 elastic perturbation
K1 asymptotic formula
K1 reconstruction
K1 substitution algorithm
K1 O-Laplacian
K1 Applied sciences
K1 Materials science
K1 Material properties
K1 Electrical properties
K1 Conductivity
K1 Physical sciences
K1 Physics
K1 Fundamental forces
K1 Electromagnetism
K1 Electricity
K1 Electric potential
K1 Mathematics
K1 Health sciences
K1 Medical diagnosis
K1 Diagnostic methods
K1 Diagnostic imaging
K1 Tomography
K1 Imaging
K1 Ultrasonography
K1 Electrical impedance
K1 Electric current
K1 Mechanics
K1 Continuum mechanics
K1 Deformation
K1 Elasticity
K1 Chemistry
K1 Chemical mixtures
K1 Inhomogeneity
JF SIAM Journal on Applied Mathematics
VO 68
IS 6
SP 1557
OP 1573
LK http://dx.doi.org/https://www.jstor.org/stable/40233587
DO https://www.jstor.org/stable/40233587
SF ELIB - SuUB Bremen

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