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Touchdown and Pull-in Voltage Behavior of a MEMS Device wit..:

Yujin Guo ; Zhenguo Pan ; Ward, M. J.
SIAM Journal on Applied Mathematics. 66 (2005) 1 - p. 309-338 , 2005

Link: https://www.jstor.org/stable/4096171

RT Journal
T1 <Title>Touchdown and Pull-in Voltage Behavior of a MEMS Device with Varying Dielectric Properties</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-4096171&Exemplar=1&LAN=DE
				
A1 Yujin Guo
A1 Zhenguo Pan
A1 Ward, M. J.
PB Society for Industrial and Applied Mathematics
YR 2005
SN 0036-1399
K1 Quenching
K1 Pull-in Voltage
K1 Saddle-Node
K1 MEMS
K1 Dielectric Permittivity
K1 Applied sciences
K1 Engineering
K1 Aerospace engineering
K1 Aviation
K1 Vehicular flight
K1 Flight operations
K1 Flight paths
K1 Aircraft landing
K1 Touchdown
K1 Materials science
K1 Material properties
K1 Electrical properties
K1 Dielectric properties
K1 Permittivity
K1 Physical sciences
K1 Physics
K1 Fundamental forces
K1 Electromagnetism
K1 Electricity
K1 Electric potential
K1 Technology
K1 Microtechnology
K1 Microelectromechanical systems
K1 Materials
K1 Dielectric materials
K1 Mathematics
K1 Mathematical procedures
K1 Approximation
K1 Structural engineering
K1 Structural deflection
K1 Electrostatics
K1 Mathematical objects
K1 Mathematical series
K1 Power series
JF SIAM Journal on Applied Mathematics
VO 66
IS 1
SP 309
OP 338
LK http://dx.doi.org/https://www.jstor.org/stable/4096171
DO https://www.jstor.org/stable/4096171
SF ELIB - SuUB Bremen

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