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Second-order bias-corrected AIC in multivariate normal line..:

YANAGIHARA, Hirokazu ; KAMO, Ken-Ichi ; TONDA, Tetsuji
The Canadian Journal of Statistics / La Revue Canadienne de Statistique. 39 (2011) 1 - p. 126-146 , 2011

Link: https://www.jstor.org/stable/41304467

RT Journal
T1 <Title>Second-order bias-corrected AIC in multivariate normal linear models under non-normality</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-41304467&Exemplar=1&LAN=DE
				
A1 YANAGIHARA, Hirokazu
A1 KAMO, Ken-Ichi
A1 TONDA, Tetsuji
PB Statistical Society of Canada
YR 2011
SN 0319-5724
K1 Applied sciences
K1 Research methods
K1 Modeling
K1 Mathematics
K1 Applied mathematics
K1 Statistics
K1 Statistical theories
K1 Estimation theory
K1 Estimation bias
K1 Applied statistics
K1 Descriptive statistics
K1 Measures of variability
K1 Statistical variance
K1 Frequency distribution
K1 Kurtosis
K1 Inferential statistics
K1 Statistical estimation
K1 Estimation methods
K1 Estimators
K1 Information science
K1 Information analysis
K1 Data analysis
K1 Regression analysis
K1 Linear regression
K1 Statistical distributions
K1 Distribution functions
K1 Probability distributions
K1 Gaussian distributions
K1 Philosophy
K1 Applied philosophy
K1 Philosophy of science
K1 Scientific method
K1 Research variables
K1 Research biases
K1 Sampling bias
K1 Pure mathematics
K1 Calculus
K1 Differential calculus
K1 Differential equations
K1 Ordinary differential equations
K1 Constant coefficients
K1 Linear algebra
K1 Matrix theory
K1 Matrices
JF The Canadian Journal of Statistics / La Revue Canadienne de Statistique
VO 39
IS 1
SP 126
OP 146
LK http://dx.doi.org/https://www.jstor.org/stable/41304467
DO https://www.jstor.org/stable/41304467
SF ELIB - SuUB Bremen

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