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Pattern Analysis and Metrology: The Extraction of Stable Fe..:
Paul J. Scott
Proceedings: Mathematical, Physical and Engineering Sciences. 460 (2004) 2050 - p. 2845-2864 , 2004
Link:
https://www.jstor.org/stable/4143077
RT Journal T1
Pattern Analysis and Metrology: The Extraction of Stable Features from Observable Measurements
UL https://suche.suub.uni-bremen.de/peid=jstor-4143077&Exemplar=1&LAN=DE A1 Paul J. Scott PB The Royal Society YR 2004 SN 1364-5021 K1 Morphological Closing Filters K1 Motif Analysis K1 Measurement Theory K1 Pattern Analysis K1 Biological sciences K1 Agriculture K1 Agricultural sciences K1 Horticulture K1 Horticultural practices K1 Pruning K1 Applied sciences K1 Materials science K1 Material properties K1 Surface texture K1 Physical sciences K1 Metrology K1 Mathematics K1 Pure mathematics K1 Topology K1 Topological theorems K1 Mathematical values K1 Critical values K1 Critical points K1 Technology K1 Tools K1 Power tools K1 Grinding wheels K1 Philosophy K1 Applied philosophy K1 Philosophy of mathematics K1 Mathematical concepts K1 Applied mathematics K1 Statistics K1 Applied statistics K1 Statistical physics K1 Dimensional analysis K1 Dimensionality K1 Abstract spaces K1 Topological spaces K1 Arts K1 Art theory K1 Motifs JF Proceedings: Mathematical, Physical and Engineering Sciences VO 460 IS 2050 SP 2845 OP 2864 LK http://dx.doi.org/https://www.jstor.org/stable/4143077 DO https://www.jstor.org/stable/4143077 SF ELIB - SuUB Bremen
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