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MICROWAVE IMAGING BY ELASTIC DEFORMATION:

AMMARI, HABIB ; CAPDEBOSCQ, YVES ; DE GOURNAY, FRÉDÉRIC..
SIAM Journal on Applied Mathematics. 71 (2011) 6 - p. 2112-2130 , 2011

Link: https://www.jstor.org/stable/41582547

RT Journal
T1 <Title>MICROWAVE IMAGING BY ELASTIC DEFORMATION</Title>

UL https://suche.suub.uni-bremen.de/peid=jstor-41582547&Exemplar=1&LAN=DE
				
A1 AMMARI, HABIB
A1 CAPDEBOSCQ, YVES
A1 DE GOURNAY, FRÉDÉRIC
A1 ROZANOVA-PIERRAT, ANNA
A1 TRIKI, FAOUZI
PB Society for Industrial and Applied Mathematics
YR 2011
SN 0036-1399
K1 Applied sciences
K1 Imaging
K1 Mathematics
K1 Physical sciences
K1 Physics
K1 Mechanics
K1 Continuum mechanics
K1 Deformation
K1 Elasticity
K1 Fundamental forces
K1 Electromagnetism
K1 Electromagnetic radiation
K1 Nonionizing radiation
K1 Radio waves
K1 Microwaves
K1 Materials science
K1 Material properties
K1 Electrical properties
K1 Conductivity
K1 Mathematical analysis
K1 Numerical analysis
K1 Numerical methods
K1 Initial guess
K1 Ultrasonography
K1 Microwave imaging
K1 Health sciences
K1 Medical diagnosis
K1 Diagnostic methods
K1 Diagnostic imaging
K1 Tomography
K1 Magnetic resonance imaging
JF SIAM Journal on Applied Mathematics
VO 71
IS 6
SP 2112
OP 2130
LK http://dx.doi.org/https://www.jstor.org/stable/41582547
DO https://www.jstor.org/stable/41582547
SF ELIB - SuUB Bremen

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