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Soft Error Reliability of VLSI Circuits: Analysis and Mitig..:
Ghavami, Behnam
;
Raji, Mohsen
- 1st ed. 2021 . , 2021
Link:
https://doi.org/10.1007/978-3-030-51610-9
RT T1
Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
UL https://suche.suub.uni-bremen.de/peid=springer-978-3-030-51610-9&Exemplar=1&LAN=DE A1 Ghavami, Behnam A1 Raji, Mohsen NO 1st ed. 2021 PB Springer International Publishing YR 2021 NO 1 Online-Ressource (114 S.) SN 9783030516109 SN 9783030516093 SN 9783030516116 SN 9783030516123 K1 Electronic circuits K1 Electronics K1 Cooperating objects (Computer systems) K1 Electronic Circuits and Systems K1 Electronics and Microelectronics, Instrumentation K1 Cyber-Physical Systems LK http://dx.doi.org/https://doi.org/10.1007/978-3-030-51610-9 DO https://doi.org/10.1007/978-3-030-51610-9 SF ELIB - SuUB Bremen
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