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1 Ergebnisse
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Accelerated life testing of one-shot devices: data collecti..:
Balakrishnan, N
;
Ling, Man Ho
;
So, Hon Yiu
- First edition . , 2021
Link:
https://onlinelibrary.wiley.com/doi/book/10.1002/97811..
RT T1
Accelerated life testing of one-shot devices: data collection and analysis
UL https://suche.suub.uni-bremen.de/peid=wiley-ubcm-1198987980&Exemplar=1&LAN=DE A1 Balakrishnan, N A1 Ling, Man Ho A1 So, Hon Yiu NO First edition PB Wiley YR 2021 NO xiii, 223 SN 9781119664031 SN 1119664039 SN 9781119663942 SN 1119663946 SN 9781119664017 SN 1119664012 SN 9781119664000 K1 Accelerated life testing K1 Failure analysis (Engineering) K1 Equipment Failure Analysis K1 Essais accélérés (Technologie) K1 Analyse des défaillances (Ingénierie) K1 accelerated aging LK http://dx.doi.org/https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031 DO https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031 SF ELIB - SuUB Bremen
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